عنوان
پدید آورنده
موضوع
رده
TK,7895,.M4,A27,2003
TK
,
7895
,.
M4
,
A27
,
2003
کتابخانه
محل استقرار
(alk. paper)
1402072554
IR
ebook21475
انگلیسی
IR
High performance memory testing
[Electronic Resource]
:design principles, fault modeling, and self-test
/ R. Dean Adams
Boston
: Kluwer Academic,
, c2003.
xiii, 246 p.
: ill. ; 25 cm.
(Frontiers in electronic testing)
e
Includes bibliographical references (p. [229]-239) and index.
Semiconductor storage devices--Testing
Computer storage devices--Testing
621
.
39
,
732
TK
,
7895
,.
M4
,
A27
,
2003
Adams, R. Dean
ایران
621.39,732
1402072554.pdf
0
0
old catalog
e
BL
1
a
Y
