عنوان
پدید آورنده
موضوع
رده
TK7871 .M52 2011eb
TK7871
.
M52
2011eb
کتابخانه
محل استقرار
1613447590 (electronic bk.)
1615037268 (electronic bk.)
9781613447598 (electronic bk.)
9781615037261 (electronic bk.)
161503725X
9781615037254
9781615037261 (e-book)
dltt
Microelectronics failure analysis
[Book]
desk reference /
edited by Richard J. Ross ; EDFAS, ASM International.
6th ed.
Materials Park, Ohio :
ASM International,
c2011.
1 online resource (xi, 660 p.) :
ill.
"ASM International, 2011, no. 09110Z"--P. 4 of cover.
Some online versions lack accompanying media packaged with the printed version.
Includes bibliographical references and indexes.
Section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information.
0
Microelectronics failure analysis.
161503725X
Microelectronics failure analysis desk reference.
Electronic apparatus and appliances-- Testing, Handbooks, manuals, etc.
Electronics-- Materials-- Defects, Handbooks, manuals, etc.
Electronics-- Materials-- Testing, Handbooks, manuals, etc.
Microelectronics-- Defects-- Testing, Handbooks, manuals, etc.
Microelectronics-- Materials-- Testing, Handbooks, manuals, etc.
621
.
381
23
TK7871
.
M52
2011eb
Ross, Richard J.
ASM International.
Electronic Device Failure Analysis Society.
Knovel (Firm)
20131119112625.0
مطالعه متن کتاب [Book]
Y
