/ Ricardo A. Maronna, R. Douglas Martin, Vaictor J. Yohai
Chichester, England
: J. Wiley
, 2006.
xx, 403 p. , ill. , 24 cm.
(Wiley series in probability and statistics.)
Print
Includes bibliographical references (p. [383]-396) and index.
Location and scale -- Measuring robustness -- Linear regression 1 -- Linear regression 2 -- Multivariate analysis -- Generalized linear models -- Time series -- Numerical algorithms -- Asymptotic theory of M-estimates -- Robust methods in S-plus -- Description of data sets.