عنوان
پدید آورنده
موضوع
رده
QC 176.84 .O7H6
QC
176
.
84
.
O7H6
کتابخانه
محل استقرار
High-resolution x-ray scattering from thin films and multilayels
Berlin
Springer-Verlag
c1999
xi, 256 p.: ill
Springer tracts in modern physics; Vol.941
Includes bibliographies
ISBN 354062029X
Vaclav Holy, Ullrich Pietsch, Tilo Baumbach
1
Optical properties ، Thin films
Optical properties ، Thin films, Multilayered
، X-rays -- Scattering
، X-rays -- Diffraction
QC
176
.
84
.
O7H6
Holy, Vaclav
AU
AU Pietsch, Ullrich
AU Baumbach, Tilo, 1961-
TI
SE
