عنوان

Hierarchical modeling for VLSI circuit testing

0-7923-9058-x

79747

انگلیسی

Hierarchical modeling for VLSI circuit testing

[Book]

/ by Debashis Bhattacharya, John P. Hayes

Boston, Dordrecht

: Kluwer Academic Publishers

, 1990

x, 159p.

: ill.

; 24 cm

The Kluwer international series in engineering and computer science. VLSI, computer architecture and digital signal processing

انگليسي

Includes bibliographical references (p.[147] - 155) and index

Integrated Circuits -- Vey large scale integration -- Testing

Integrated Circuits -- Vey large scale integation -- Computer simulation

7874

B484

1990

Bhattacharya

, Debashis

, author

Hayes

, John P (John Patrick)

, 1944-

Iran

Central Library Of Tehran University

Old cataloging