عنوان
پدید آورنده
موضوع
رده
QC 611.8 .S5C48 1993
QC
611
.
8
.
S5C48
1993
کتابخانه
محل استقرار
0750691727
IR
49757
انگلیسی
IR
Characterization in silicon processing /editor, Yale Strusser ; contributing editors, C.R. Brundle, Gary E. McGuire ; managing editor, Lee E. Fitzpatrick.
[Book]
Boston :Greenwich :
: Butterworth-Heinemann ;
, c1993.
xiii, 240 p.
:ill.
;25 cm.
Materials characterization series
Includes bibliographical references and index.
Silicon.
Electric conductors.
Semiconductor films.
Surface chemistry
QC
611
.
8
.
S5C48
1993
Strausser, Yale.
Iran
University of Tehran. Library of Technical Camp 2
Old cataloging
p
BL
1
Y
