Secondary ion mass spectrometry SIMSX: Proceedings of the tenth international conference on secondary ion mass spectrometry (SIMSX) university of Muenster, Germany, October 1- 6, 1995
First Statement of Responsibility
Editor A. Benninghoven
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Chichester
Name of Publisher, Distributor, etc.
John Wiley
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xxv, 1057 P.; 24 c.m
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Includes indexes
TOPICAL NAME USED AS SUBJECT
Entry Element
Chemistry - Ion spectrometry
LIBRARY OF CONGRESS CLASSIFICATION
Class number
QD
,
96
,.
I5
PERSONAL NAME - PRIMARY RESPONSIBILITY
Entry Element
Conference on secondary ion mass spectrometry (SIMSX), Muenster, Germany, October 1- 6, 1995