عنوان
پدید آورنده
موضوع
رده
TK 7874 .75 .L35 1997
TK
7874
.
75
.
L35
1997
کتابخانه
محل استقرار
OTHER STANDARD IDENTIFIER
Standard Number
115635
Standard Number
120722
LANGUAGE OF THE ITEM
.Language of Text, Soundtrack etc
تابستان۷۷
.Language of Text, Soundtrack etc
English
TITLE AND STATEMENT OF RESPONSIBILITY
General Material Designation
)50-91(
First Statement of Responsibility
Lala, Parag K.
Title Proper
Digital circuit testing and testability
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
San Diego
Name of Publisher, Distributor, etc.
Academic Press
Date of Publication, Distribution, etc.
1997
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xii, 199 p.: ill.; 23 cm
GENERAL NOTES
Text of Note
Includes bibliographical references and index
TOPICAL NAME USED AS SUBJECT
Entry Element
، Integrated circuits-- Very large scale integration-- Testing
Entry Element
، Digital integrated circuits-- Testing
Entry Element
، Integrated circuits-- Fault tolerance
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7874
.
75
.
L35
1997
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
AU
Entry Element
Parag K.Lala
TI
LOCATION AND CALL NUMBER
Shelving Form of Title, Author, Author/Title
129
Shelving Form of Title, Author, Author/Title
05
