Secondary ion mass spectrometry, SIMS II; Proceeding of the second internatioanl conference on secondary ion mass spectrometry )SIMS II( Stanford University, Stanford, California, USA August 27-31, 1979
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Berlin
Name of Publisher, Distributor, etc.
Springer-Verlag
Date of Publication, Distribution, etc.
1979
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xiii, 269p.: ill
SERIES
Other Title Information
Springer series in chemical physics; 9
GENERAL NOTES
Text of Note
Includes bibliographical references
NOTES PERTAINING TO TITLE AND STATEMENT OF RESPONSIBILITY
Text of Note
editors: A Benninghoven ... ]et al.[
ORIGINAL VERSION NOTE
Text of Note
1
TOPICAL NAME USED AS SUBJECT
Entry Element
Congresses ، Mass spectrometry
LIBRARY OF CONGRESS CLASSIFICATION
Class number
QD
96
.
M3
I57
1979
PERSONAL NAME - PRIMARY RESPONSIBILITY
Relator Code
AU
AU Benninghoven, A
TI
SE
CORPORATE BODY NAME - PRIMARY RESPONSIBILITY
Entry Element
International Conference on Secondary Ion Mass Spectrometry, )2nd: Stanford Univ. 1979(