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Testing and reliable design of CMOS circuits
پدید آورنده
Jha, Niraj K.
موضوع
، Metal oxide semiconductors, Complimentary- Testing,، Metal oxide semiconductors, Complimentary- Reliability,، Integrated circuits- Very large scale integration- Design and construction
رده
TK
7871
.
99
.
M44J49
1990
کتابخانه
Library of Niroo Research Institue
محل استقرار
استان:
Tehran
ـ شهر:
Tehran
تماس با کتابخانه :
9
-
88079401
-
021
TITLE AND STATEMENT OF RESPONSIBILITY
Title Proper
Testing and reliable design of CMOS circuits
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Boston
Name of Publisher, Distributor, etc.
Kluwer Academic Publishers
Date of Publication, Distribution, etc.
c1990
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xii, 231 p. :ill. ;25 cm
SERIES
Other Title Information
Kluwer international series in engineering and computer science ; SECS 88.
Other Title Information
VLSI, computer architecture, and digital signal processing
GENERAL NOTES
Text of Note
Includes bibliographical references.
NOTES PERTAINING TO TITLE AND STATEMENT OF RESPONSIBILITY
Text of Note
by Niraj K. Jha. and Sandip Kundu
ORIGINAL VERSION NOTE
Text of Note
1
TOPICAL NAME USED AS SUBJECT
Entry Element
، Metal oxide semiconductors, Complimentary- Testing
Entry Element
، Metal oxide semiconductors, Complimentary- Reliability
Entry Element
، Integrated circuits- Very large scale integration- Design and construction
DEWEY DECIMAL CLASSIFICATION
Number
621
.
39/732
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
7871
.
99
.
M44J49
1990
OTHER CLASS NUMBERS
Class number
NO
PERSONAL NAME - PRIMARY RESPONSIBILITY
Entry Element
Jha, Niraj K.
Relator Code
AU
AU Kundu, Sandip.
TI
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