عنوان

Atomic force microscopy/scanning tunneling microscopy 3

شابک

0306462974

شابک

0306470950

شابک

9780306462979

شابک

9780306470950

شماره

b553040

عنوان اصلي

Atomic force microscopy/scanning tunneling microscopy 3

نام عام مواد

[Book]

نام نخستين پديدآور

edited by Samuel H. Cohen and Marcia L. Lightbody.

محل نشرو پخش و غیره

New York

نام ناشر، پخش کننده و غيره

Kluwer Academic Publishers

تاریخ نشرو بخش و غیره

2002

متن يادداشت

Preface. Keynote Paper: A Practical Approach to Understanding Surface Metrology and Its Applications; C.A. Brown. Applications of Scanning Probe Microscopy in Materials Science: Examples of Surface Modification and Quantitative Analysis; P. von Blanckenhagen. Scanning Probe Microscopy in Biology with Potential Applications in Forensics; J. Vesenka, E. Morales. Atomic Manipulation of Hydrogen on Hydrogen-Terminated Silicon Surfaces with Scanning Tunneling Microscope; D.H. Huang, Y. Yamamoto. Apollo 11 Lunar Samples: An Examination Using Tapping Mode Atomic Force Microscopy and Other Microscopic Methods; E.C. Hammond, et al. Novel Micromachined Cantilever Sensors for Scanning Near-Field Microscopy; W. Scholz, et al. Imaging of Cell Surface Structure by Scanning Probe Microscopy; V.A. Fedirko, et al. A Force Limitation for Successful Observation of Atomic Defects: Defect Trapping of the Atomic Force Microscopy Tip; I.Y. Sokolov, et al. A New Approach To Examine Interfacial Interaction Potential Between a Thin Solid Film or a Droplet and a Smooth Substrate; R. Mu, et al. Nanometer-Scale Patterning of Surfaces Using Self-Assembly Chemistry. 1. Preliminary Studies of Polyaniline Electrodeposition on Self-Assembled Mixed Monolayers; W.A. Hayes, C. Shannon. Local Rate of Electroless Copper Deposition by Scanning Tunneling Microscopy; C.J. Weber, et al. Atomic Force Microscopy of Olivine; C. Wilson, et al. The Study of Sublimation Rates and Nucleation and Growth of TNT and PETN on Silica and Graphite Surfaces by Optical and Atomic Force Microscopy and Ellipsometry; Y.S. Tung, et al. Peculiarities of the Scanning Tunneling Microscopy Probe on Porous Gallium Phosphide; V.M. Ichizli, et al. Influence of Doping Concentration on The Etching Rate of GaAs Studied by Atomic Force Microscopy; R.S. Freitas, et al.Comparative Scanning Tunneling Microscopy Studies of CoFe2O4 Nanoparticles of Ferrofluids in Acidic Medium; D. Dai, et al. From Laboratory Measurements to the First In-Situ Analysis of Pristine Cometary Grains; J. Romstedt, et al. Synthesis of Prebiotic Peptides and Oligonucleotides on Clay Mineral Surfaces: A Scanning Force Microscopy Study; T.L. Porter, et al. Surface Structure and Intercalative Polymerization Studies of Smectite Clay Thin Films; T.L. Porter, et al. Atomic Force Microscopy A New and Complementary Tool in Asphalt Research Compared to Scanning Electron Microscopy; L. Loeber, et al. Index.

موضوع مستند نشده

Microscòpia d'escombratge per efecte túnel.

موضوع مستند نشده

Microscòpia electrònica de rastreig.

موضوع مستند نشده

Microscòpia electrònica d'escombratge.

شماره رده

نشانه اثر

مستند نام اشخاص تاييد نشده

edited by Samuel H. Cohen and Marcia L. Lightbody.

مستند نام اشخاص تاييد نشده

Marcia L Lightbody

مستند نام اشخاص تاييد نشده

Samuel H Cohen

نام الکترونيکي

نوع ماده

[Book]

تكميل شده

Y