عنوان

Timing performance of nanometer digital circuits under process variations /

شابک

3030092399

شابک

3319754653

شابک

3319754661

شابک

9783030092399

شابک

9783319754659

شابک

9783319754666

شابک اشتباه

3319754645

شابک اشتباه

9783319754642

عنوان اصلي

Timing performance of nanometer digital circuits under process variations /

نام عام مواد

[Book]

نام نخستين پديدآور

Victor Champac, Jose Garcia Gervacio.

محل نشرو پخش و غیره

Cham, Switzerland :

نام ناشر، پخش کننده و غيره

Springer,

تاریخ نشرو بخش و غیره

[2018]

تاریخ نشرو بخش و غیره

©2018

نام خاص و کميت اثر

1 online resource

عنوان فروست

Frontiers in electronic testing ;

مشخصه جلد

Volume 39

متن يادداشت

Includes bibliographical references and index.

متن يادداشت

Intro; Preface; Contents; About the Authors; Acronyms; 1 Introduction; 1.1 Semiconductor Technology; 1.2 First Words of Process Variations on Semiconductor Technologies; 1.3 Making Modern Digital Circuits; 1.3.1 Nanometer Design; 1.3.2 Impact of Process Variation on Nanometer Design; 1.3.3 Corner-Based Nanometer Design; 1.4 Need of Statistical Circuit Design; References; 2 Mathematical Fundamentals; 2.1 Basic Definitions; 2.1.1 Definitions; 2.2 Random Variables; 2.2.1 Discrete Random Variables; 2.2.1.1 Probability Mass Function; 2.2.1.2 Cumulative Distribution Function.

متن يادداشت

2.2.2 Continuous Random Variables2.2.2.1 Probability Density Function; 2.2.2.2 Cumulative Distribution Function; 2.3 Characteristics of Random Variables; 2.3.1 Mean; 2.3.1.1 Discrete Variables; 2.3.1.2 Continuous Variables; 2.3.2 Variance; 2.3.2.1 Discrete Variables; 2.3.2.2 Continuous Variables; 2.4 Distributions of Random Variables; 2.4.1 Continuous Uniform Distribution; 2.4.2 Continuous Normal Distribution; 2.5 Relationship Properties of Random Variables; 2.5.1 Covariance; 2.5.1.1 Discrete Variables; 2.5.1.2 Continuous Variables; 2.5.2 Correlation; 2.6 Sum of Normal Random Variables.

متن يادداشت

2.6.1 Sum of Two Normal Random Variables2.6.1.1 Mean; 2.6.1.2 Variance; 2.6.2 Sum of More than Two Normal Random Variables; 2.6.2.1 Mean; 2.6.2.2 Variance; 2.7 Series and Theorem of Taylor; 2.7.1 Basic Definitions; 2.7.2 Single Variable; 2.7.3 Two Variables; 2.8 Summary; References; 3 Process Variations; 3.1 Introduction; 3.2 CMOS Manufacturing Process; 3.2.1 CMOS Technology Overview; 3.2.2 Main Manufacturing Processes; 3.2.2.1 Photolithography; 3.2.2.2 Etching; 3.2.2.3 Doping; 3.2.2.4 Deposition; 3.2.2.5 Planarization; 3.3 Sources of Process Variations.

متن يادداشت

3.3.1 Sources of Variation on Device Parameters3.3.1.1 Sources of Variation in the Channel Length; 3.3.1.2 Line Edge Roughness; 3.3.1.3 Optical Proximity Effect; 3.3.1.4 Sources of Variation in the Channel Width; 3.3.1.5 Sources of Variation in the Gate Oxide Thickness; 3.3.1.6 Sources of Variation in the Threshold Voltage; 3.3.1.7 Random Dopant Fluctuation; 3.3.2 Sources of Variation in Interconnections; 3.3.2.1 Chemical Mechanical Polishing; 3.4 Behavior of Process Parameter Variations; 3.4.1 Systematic; 3.4.2 Nonsystematic; 3.4.2.1 Inter-die Variations; 3.4.2.2 Intra-Die Variations.

متن يادداشت

3.5 Parameter Modeling3.6 Spatial Correlation Modeling; 3.6.1 Exponential Model; 3.6.1.1 Example; 3.6.2 Grid Model; 3.7 Summary; References; 4 Gate Delay Under Process Variations; 4.1 Mathematical Formulation of the Statistical Delay of a Logic Gate; 4.1.1 Mean Delay of a Gate; 4.1.2 Variance of the Delay of a Gate; 4.2 Delay of Logic Gates Under Process Variations; 4.3 Computing Delay Variance of an Inverter; 4.3.1 Analytical Delay Model; 4.3.2 Sensitivity Delay Model; 4.3.3 Example of Computing Delay Standard Deviation of an Inverter; 4.4 Computing Delay Variance of a Nand Gate.

بدون عنوان

0

بدون عنوان

8

بدون عنوان

8

بدون عنوان

8

بدون عنوان

8

متن يادداشت

This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming use of analytical formulations. Emphasis is placed on providing digital designers with understanding of the sources of process variations, their impact on circuit performance and tools for improving their designs to comply with product specifications. Various circuit-level "design hints" are highlighted, so that readers can use then to improve their designs. A special treatment is devoted to unique design issues and the impact of process variations on the performance of FinFET based circuits. This book enables readers to make optimal decisions at design time, toward more efficient circuits, with better yield and higher reliability.

منبع سفارش / آدرس اشتراک

Springer Nature

شماره انبار

com.springer.onix.9783319754659

عنوان

Timing performance of nanometer digital circuits under process variations.

شماره استاندارد بين المللي کتاب و موسيقي

9783319754642

موضوع مستند نشده

Integrated circuits-- Design and construction.

موضوع مستند نشده

Nanoelectronics-- Materials.

موضوع مستند نشده

Radio circuits.

موضوع مستند نشده

Circuits & components.

موضوع مستند نشده

Computer architecture & logic design.

موضوع مستند نشده

Electronics engineering.

موضوع مستند نشده

Integrated circuits-- Design and construction.

موضوع مستند نشده

Radio circuits.

موضوع مستند نشده

TECHNOLOGY & ENGINEERING-- Mechanical.

موضوع مستند نشده

TEC-- 009070

موضوع مستند نشده

TJFC

موضوع مستند نشده

TJFC

شماره

ويراست

شماره رده

مستند نام اشخاص تاييد نشده

Champac, Victor

مستند نام اشخاص تاييد نشده

Gervacio, Jose Garcia

تاريخ عمليات

20200823105938.0

قواعد فهرست نويسي ( بخش توصيفي )

pn

نام الکترونيکي

نوع ماده

[Book]

تكميل شده

Y