عنوان
پدید آورنده
موضوع
رده
TK 7874 .B22W3 2010
TK
7874
.
B22W3
2010
کتابخانه
محل استقرار
9781596939899
9781596939899
1282
انگلیسی
Boston
Artech House,
c2010
xv, 198 p. , ill. , 24 cm.
Title
000
Includes bibliographical references and index.
Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty
Integrated circuits, Testing
Integrated circuits, Wafer-scale integration
Semiconductors, Testing
621
B34W
.
3815
TK
7874
.
B22W3
2010
Bahukudumbi, Sudarshan.
Chakrabarty, Krishnendu.
1
English Book
غیرمرجع
