عنوان
پدید آورنده
موضوع
رده
TK 7874 .B22W3 2010
TK
7874
.
B22W3
2010
کتابخانه
محل استقرار
INTERNATIONAL STANDARD BOOK NUMBER
(Number (ISBN
9781596939899
(Number (ISBN
9781596939899
OTHER STANDARD IDENTIFIER
Standard Number
1282
LANGUAGE OF THE ITEM
.Language of Text, Soundtrack etc
انگلیسی
.PUBLICATION, DISTRIBUTION, ETC
Place of Publication, Distribution, etc.
Boston
Name of Publisher, Distributor, etc.
Artech House,
Date of Publication, Distribution, etc.
c2010
PHYSICAL DESCRIPTION
Specific Material Designation and Extent of Item
xv, 198 p. , ill. , 24 cm.
GENERAL NOTES
Text of Note
Title
NOTE RELATING TO THE COPY IN HAND
Text of Note
000
INTERNAL BIBLIOGRAPHIES/INDEXES NOTE
Text of Note
Includes bibliographical references and index.
UNIFORM TITLE
General Material Designation
Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty
TOPICAL NAME USED AS SUBJECT
Entry Element
Integrated circuits, Testing
Entry Element
Integrated circuits, Wafer-scale integration
Entry Element
Semiconductors, Testing
DEWEY DECIMAL CLASSIFICATION
Number
621
Edition
B34W
.
3815
LIBRARY OF CONGRESS CLASSIFICATION
Class number
TK
Book number
7874
Classification Record Number
.
B22W3
2010
PERSONAL NAME - PRIMARY RESPONSIBILITY
Entry Element
Bahukudumbi, Sudarshan.
PERSONAL NAME - SECONDARY RESPONSIBILITY
Entry Element
Chakrabarty, Krishnendu.
LOCATION AND CALL NUMBER
Shelving Form of Title, Author, Author/Title
1
English Book
غیرمرجع
